JPS6448038U - - Google Patents
Info
- Publication number
- JPS6448038U JPS6448038U JP14256487U JP14256487U JPS6448038U JP S6448038 U JPS6448038 U JP S6448038U JP 14256487 U JP14256487 U JP 14256487U JP 14256487 U JP14256487 U JP 14256487U JP S6448038 U JPS6448038 U JP S6448038U
- Authority
- JP
- Japan
- Prior art keywords
- dual
- line package
- view
- bumper
- terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000009977 dual effect Effects 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 claims description 2
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14256487U JPS6448038U (en]) | 1987-09-18 | 1987-09-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14256487U JPS6448038U (en]) | 1987-09-18 | 1987-09-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6448038U true JPS6448038U (en]) | 1989-03-24 |
Family
ID=31408631
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14256487U Pending JPS6448038U (en]) | 1987-09-18 | 1987-09-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6448038U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7304489B2 (en) | 2000-08-21 | 2007-12-04 | Tokyo Electron Limited | Inspection method and inspection apparatus |
-
1987
- 1987-09-18 JP JP14256487U patent/JPS6448038U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7304489B2 (en) | 2000-08-21 | 2007-12-04 | Tokyo Electron Limited | Inspection method and inspection apparatus |
| US7319339B2 (en) | 2000-08-21 | 2008-01-15 | Tokyo Electron Limited | Inspection apparatus to break the oxide of an electrode by fritting phenomenon |